Committee > Technical Program
| Technical Program Chairs |
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| Guillaume BASCOUL |
CNES Toulouse (France) |
| Alexandra GRACIA |
IMS, University of Bordeaux (France) |
| Nathalie LABAT |
IMS, University of Bordeaux (France) |
| Nicolas NOLHIER |
LAAS-CNRS, University of Toulouse (France) |
| Loic THEOLIER |
IMS, University of Bordeaux (France) |
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| Sub-committee Chairs |
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Topic A: Quality and Reliability assessment techniques and methods for Devices and Systems
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| Edgar OLTHOF |
NXP (Netherlands) |
| Cora SALM |
University of Twente (Netherlands) |
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Topic B: Semiconductor Failure Mechanisms & Reliability for Si technologies & Nanoelectronics
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| Michael WALTL |
TU Wien(Austria) |
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Topic C: Progress in Failure Analysis: Defect Detection and Analysis
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| Samuel CHEF |
Nanyang Technological University (Singapour) |
| Pascal GOUNET |
STMicroelectronics (France) |
| Giovanna MURA |
University of Cagliari (Italy) |
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Topic D: Reliability of Microwave devices and circuits
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| Michael DAMMANN |
Fraunhofer IAF (Germany) |
| Jean-Guy TARTARIN |
LAAS-CNRS, University of Toulouse (France) |
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Topic E: Packaging and Assembly : Reliability and Failure Analysis
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| Paolo COVA |
University of Parma (Italy) |
| René RONGEN |
NXP (France) |
| Kirsten WEIDE-ZAAGE |
NXP (Germany) |
| Olaf WITTLER |
Fraunhofer IZM (Germany) |
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| F : Power Devices and Electronic System : Reliability and Failure Analysis |
Topic F1: Smart-power devices, IGBT, Thyristors
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| Mounira BOUAROUDJ |
SATIE, Université of Saclay(France) |
| Mauro CIAPPA |
ETH Zurich (Switzerland) |
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Topic F2: SiC and GaN power devices
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| Matteo MENEGHINI |
University of Padova (Italy) |
| David TREMOUILLES |
LAAS-CNRS, University of Toulouse (France) |
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Topic F3: Power Electronic System
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| Frédéric RICHARDEAU |
LAPLACE, University of Toulouse (France) |
| Valeria RUSTICHELLI |
IRT-Saint Exupery (France) |
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Topic G: Photonics Reliability
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| Yannick DESHAYES |
IMS, University of Bordeaux (France) |
| Michel GARCIA |
III-V Lab, Thales (France) |
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Topic H: MEMS and sensors Reliability
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| Loukas MICHALAS |
Democritus University of Thrace (Greece) |
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I : Extreme environments
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Topic I1: ESD and EMC
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| Fabrice CAIGNET |
LAAS-CNRS, University of Toulouse (France) |
| Tristan DUBOIS |
IMS, University of Bordeaux (France) |
| Genevieve DUCHAMP |
IMS, University of Bordeaux (France) |
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Topic I2: Radiation
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| Francesco PINTACUDA |
STMicroelectronics (Italy) |
| Jean-Baptiste SAUVEPLANE |
CNES (France) |
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