Programme > Tutorial
ESREF 2025 Tutorial
Reliability aspects of novel device architectures
Erik Bury, IMEC, Belgium
This talk will address front-end reliability considerations and the associated challenges arising from the transition to Gate-All-Around (GAA) MOSFET architectures in advanced logic technologies. We will also explore emerging device architectures—such as Forksheet FETs—that enable continued logic cell scaling. The tutorial will further delve into the unique integration challenges introduced by these novel structures and assess their implications on both time-zero and time-dependent device performance
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Erik Bury received the B.Sc., M.Sc. and PhD degrees in Electronic Engineering from the Katholieke Universiteit Leuven - Belgium, in 2009, 2011 and 2016 respectively. He is currently leading the Test, Software & Circuits group (TSC) group and principal member of technical staff within the advanced reliability and robustness department of imec. His main research interests involve device self-heating effects, channel hot carrier degradation and bias temperature instabilities. He received the IPFA Best Paper award (in reliability) in 2014 and IRPS Best Paper award in 2022. He is serving or served as a technical program committee member for ESSDERC, IPFA and IRPS.
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